August 7, 2018
International Symposium on Integrated Network Management 8-12 April 2019, Washington DC , USA
Submission Deadline: August 19, 2018
Accepted formats: IEEE 2-column papers and annotated slides.
Submit your paper at: https://jems.sbc.org.br/home.cgi?c=3129
The IFIP/IEEE IM 2019 symposium will include an Experience Session program. Experience Sessions will complement the Technical Sessions with contributions that emphasize practical experiences and lessons learned in applying, implementing, and deploying management technologies. They will focus on aspects such as real-world deployment scenarios, experiences with the management of new services and technology, industrial applications of management technologies, implementation examples of new management technologies, organizational impact, and business cases. Experience Sessions are particularly aimed at decision makers and experts from industry.
Topics of Interest:
Specific topics include but are not limited to the ones listed below.
Please refer also to the general Call for Papers.
Authors are invited so submit their papers using the JEMS conference submission system at https://jems.sbc.org.br/home.cgi?c=3129
Papers for the Experience Sessions must be written in English and adhere to one of the following two format options:
Option 1: Annotated slides. Papers should have a visual in the upper half of a page and the explanatory text in the lower half. Paper submissions must not exceed 15 annotated visuals including title and references, in PDF only.
Option 2: IEEE 2-column format. This is the same format as for Technical Sessions. Paper submissions must not exceed 6 pages, in PDF only.
The papers accepted for publication in the Experience Sessions, and actually presented at the symposium by one of the authors (as per the IEEE no show policy), will be published in the official electronic proceedings of IM 2019 in IEEE Xplore.
For more information, please contact us at email@example.com
Experience Session Co-chairs:
Rémi Badonnel, Telecom Nancy - University of Lorraine, LORIA/INRIA, France Giovane C.M. Moura, SIDN Labs and TU Delft, The Netherlands